IEC 60749-13 Ed. 1.0被替代
Semiconductor devices - Mechanical and climatic test methods Part 13: Salt atmosphere
出版：International Electrotechnical Committee
专家解读视频
Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive. The contents of the corrigendum of August 2003 have been included in this copy.
OVE/ONORM EN 60749-13:2003 - Identical
NEN EN IEC 60749-13:2002 - Identical
EN 60749-13:2002 - Identical
PN EN 60749-13:2004 - Identical
NF EN 60749-13:2002 - Identical
BS EN 60749-13:2002 - Identical
CEI EN 60749-13 Ed. 1 (2004) - Identical
UNE EN 60749-13:2003 - Identical
DIN EN 60749-13 (2003-04) - Identical
I.S. EN 60749-13:2002 - Identical
