DIN EN 60749-13 (2003-04)现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 13: Salt Atmosphere
出版：German Institute for Standardisation (Deutsches Institut für Normung)
专家解读视频
Gives a salt atmosphere test that determine the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices which specified for a marine environment.
Supersedes DIN EN 60749 (06/2005)
NF EN 60749-13:2002 - Identical
NBN EN 60749-13:2003 - Identical
BS EN 60749-13:2002 - Identical
IEC 60749-13 Ed. 1.0 - Identical
I.S. EN 60749-13:2002 - Identical
SS EN 60749-13 Ed. 1 (2003) - Identical
UNE EN 60749-13:2003 - Identical
EN 60749-13:2002 - Identical
