NF EN 60749-11:2002现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 11: Rapid Change Of Temperature - Two-fluid-bath Method
出版：Association Francaise de Normalisation
专家解读视频
Describes the rapid change of temperature test method and the two-fluid-bath method. It is applicable to all semiconductor devices.
Indice de classement: C96-022-11. (03/2003) Supersedes NF EN 60749. (06/2007)
EN 60749-11:2002 - Identical
UNE EN 60749-11:2003 - Identical
SS EN 60749-11 Ed. 1 (2003) - Identical
IEC 60749-11 Ed. 1.0 - Identical
I.S. EN 60749-11:2002 - Identical
NBN EN 60749-11:2003 - Identical
DIN EN 60749-11 (2003-04) - Identical
BS EN 60749-11:2002 - Identical
