NF EN 60749-31:2003现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 31: Flammability Of Plastic-encapsulated Devices (internally Induced)
出版：Association Francaise de Normalisation
专家解读视频
Applies to semiconductor devices (discrete devices and integrated circuits). It determines whether the device ignites due to internal heating caused by excessive overloads.
Indice de classement: C96-022-31. (12/2003) Supersedes NF EN 60749. (06/2007)
SN EN 60749-31:2003 - Identical
BS EN 60749-31:2003 - Identical
DIN EN 60749-31 (2003-12) - Identical
NBN EN 60749-31:2004 - Identical
I.S. EN 60749-31:2003 - Identical
IEC 60749-31 Ed. 1.0 - Identical
SS EN 60749-31 Ed. 1 (2003) - Identical
UNE EN 60749-31:2004 - Identical
EN 60749-31:2003 - Identical
