SS EN 60749-31 Ed. 1 (2003)现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 31: Flammability Of Plastic-encapsulated Devices (internally Induced)
出版：Standardiserings-Kommissionen I Sverige
专家解读视频
Applies to semiconductor devices (discrete devices and integrated circuits). It determines whether the device ignites due to internal heating caused by excessive overloads.
SN EN 60749-31:2003 - Identical
BS EN 60749-31:2003 - Identical
DIN EN 60749-31 (2003-12) - Identical
NBN EN 60749-31:2004 - Identical
NF EN 60749-31:2003 - Identical
I.S. EN 60749-31:2003 - Identical
IEC 60749-31 Ed. 1.0 - Identical
UNE EN 60749-31:2004 - Identical
EN 60749-31:2003 - Identical
