SN EN 60749-31:2003现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 31: Flammability Of Plastic-encapsulated Devices (internally Induced)
出版：Swiss Standards
专家解读视频
Applies to semiconductor devices (discrete devices and integrated circuits). It determines whether the device ignites due to internal heating caused by excessive overloads.
SS EN 60749-31 Ed. 1 (2003) - Identical
IEC 60749-31 Ed. 1.0 - Identical
BS EN 60749-31 : 2003 - Identical
DIN EN 60749-31 : 2003 - Identical
I.S. EN 60749-31:2003 - Identical
NBN EN 60749-31 : 2004 - Identical
UNE EN 60749-31 : 2004 - Identical
I.S. EN 60749-31:2003 - Identical
BS EN 60749-31 : 2003 - Identical
DIN EN 60749-31 : 2003 - Identical
EN 60749-31 : 2003 - Identical
NF EN 60749-31 : 2003 - Identical
IEC 60749-31 : 1.0 - Identical
NBN EN 60749-31:2004 - Identical
NF EN 60749-31:2003 - Identical
I.S. EN 60749-31:2003 - Identical
UNE EN 60749-31:2004 - Identical
EN 60749-31:2003 - Identical
BS EN 60749-31:2003 - Identical
DIN EN 60749-31 (2003-12) - Identical
