NF EN 60749-1:2003现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 1: General
出版：Association Francaise de Normalisation
专家解读视频
Applies to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.
Indice de classement: C96-022-1. PR NF EN 60749-1 August 2001 (07/2001) Supersedes NF EN 60749. (06/2007)
SS EN 60749-1 Ed. 1 (2003) - Identical
UNE EN 60749-1:2004 - Identical
IEC 60749-1 Ed. 1.0 - Identical
I.S. EN 60749-1:2003 - Identical
NBN EN 60749-1:2004 - Identical
DIN EN 60749-1 (2003-12) - Identical
BS EN 60749-1:2003 - Identical
SN EN 60749-1:2003 - Identical
