SS EN 60749-1 Ed. 1 (2003)现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 1: General
出版：Standardiserings-Kommissionen I Sverige
专家解读视频
Applies to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.
Supersedes SS EN 60749 (03/2006)
UNE EN 60749-1:2004 - Identical
I.S. EN 60749-1:2003 - Identical
NF EN 60749-1:2003 - Identical
NBN EN 60749-1:2004 - Identical
DIN EN 60749-1 (2003-12) - Identical
BS EN 60749-1:2003 - Identical
SN EN 60749-1:2003 - Identical
