SS EN 60749-13 Ed. 1 (2003)现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 13: Salt Atmosphere
出版：Standardiserings-Kommissionen I Sverige
专家解读视频
Gives a salt atmosphere test that determine the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices which specified for a marine environment.
UNE EN 60749-13:2003 - Identical
IEC 60749-1 Ed. 1.0 - Identical
I.S. EN 60749-13:2002 - Identical
NF EN 60749-13:2002 - Identical
NBN EN 60749-13:2003 - Identical
DIN EN 60749-13 (2003-04) - Identical
BS EN 60749-13:2002 - Identical
EN 60749-13:2002 - Identical
