IEC 60749-31 : 1.0现行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 31: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (INTERNALLY INDUCED)
出版：International Electrotechnical Committee
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基本信息
标准编号： IEC 60749-31 : 1.0
发布时间：2002/8/30 0:00:00
标准类别：Standard
出版单位：International Electrotechnical Committee
标准页数：19
标准简介
Applies to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads.
