其他半导体器件 -环标网

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每页显示20 条，共找到 558 条结果 <6/28>

标准编号	标准名称	发布部门	发布日期	状态
SS EN 62031:2008	Led Modules For General Lighting - Safety Specifications	Standardis..	2015-02-18	现行
BS EN 62031:2008+A2:2015	Led Modules For General Lighting - Safety Specifications	British St..	2015-01-31	现行
GOST IEC 62384:2013	Dc Or Ac Supplied Electronic Control Gear For Led Modules - Performance Requirements	Interstand..	2015-01-01	现行
JIS C 5630-18:2014	Semiconductor Devices - Micro-electromechanical Devices - Part 18: Bend Testing Methods Of Thin Film Materials	Japanese S..	2014-12-22	现行
JIS C 5630-19:2014	Semiconductor Devices - Micro-electromechanical Devices - Part 19: Electronic Compasses	Japanese S..	2014-12-22	现行
SS EN 62047-21 Ed. 1 (2014)	Semiconductor Devices - Micro-Electromechanical Devices - Part 21: Test Method For Poisson's Ratio Of Thin Film Mems Materials	Standardis..	2014-12-18	现行
SS EN 62047-22 Ed. 1 (2014)	Semiconductor Devices - Micro-Electromechanical Devices - Part 22: Electromechanical Tensile Test Method For Conductive Thin Films On Flexible Substrates	Standardis..	2014-12-18	现行
SS EN 62047-20 Ed. 1 (2014)	Semiconductor Devices - Micro-Electromechanical Devices - Part 20: Gyroscopes	Standardis..	2014-12-18	现行
NF EN 62047-20:2014	Semiconductor Devices - Micro-Electromechanical Devices - Part 20: Gyroscopes	Associatio..	2014-12-01	现行
NF EN 62047-22:2014	Semiconductor Devices - Micro-Electromechanical Devices - Part 22: Electromechanical Tensile Test Method For Conductive Thin Films On Flexible Substrates	Associatio..	2014-12-01	现行
NF EN 62047-21:2014	Semiconductor Devices - Micro-Electromechanical Devices - Part 21: Test Method For Poisson's Ratio Of Thin Film Mems Materials	Associatio..	2014-12-01	现行
PD CLC/TR 62258-4:2013	Semiconductor Die Products - Part 4: Questionnaire For Die Users And Suppliers	British St..	2014-11-30	现行
DS EN 62047-21:2014	Semiconductor Devices - Micro-Electromechanical Devices - Part 21: Test Method For Poisson's Ratio Of Thin Film Mems Materials	Danish Sta..	2014-11-20	现行
DS EN 62047-20:2014	Semiconductor Devices - Micro-Electromechanical Devices - Part 20: Gyroscopes	Danish Sta..	2014-11-20	现行
NBN EN 62047-21:2014	Semiconductor Devices - Micro-Electromechanical Devices - Part 21: Test Method For Poisson's Ratio Of Thin Film Mems Materials	Belgian St..	2014-11-01	现行
NBN EN 62047-22:2014	Semiconductor Devices - Micro-Electromechanical Devices - Part 22: Electromechanical Tensile Test Method For Conductive Thin Films On Flexible Substrates	Belgian St..	2014-11-01	现行
NBN EN 62047-20:2014	Semiconductor Devices - Micro-Electromechanical Devices - Part 20: Gyroscopes	Belgian St..	2014-11-01	现行
BS EN 62047-21:2014	Semiconductor Devices - Micro-Electromechanical Devices - Part 21: Test Method For Poisson's Ratio Of Thin Film Mems Materials	British St..	2014-10-31	现行
BS EN 62047-20:2014	Semiconductor Devices - Micro-Electromechanical Devices - Part 20: Gyroscopes	British St..	2014-10-31	现行
I.S. EN 62047-21:2014	Semiconductor Devices - Microelectromechanical Devices Part 21: Test Method for Poisson's Ratio of Thin Film Mems Materials	National S..	2014-10-27	现行

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