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每页显示20 条，共找到 285 条结果 <1/15>

	标准编号	标准名称	发布部门	发布日期	状态
	BIS IS 14901:Part 8:2020	Semiconductor Devices — Discrete Devices Part 8 Field-Effect Transistors ( Second Revision )	Bureau of ..	2020-03-08	现行
	IEC 60747-7:2010/AMD1:2019	Amendment 1 - Semiconductor devices - Discrete devices - Part 7: Bipolar transistors	Internatio..	2020-03-08	现行
	IEC 60747-7:2010	Semiconductor devices - Discrete devices - Part 7: Bipolar transistors	Internatio..	2020-03-08	现行
	BIS IS 14901:Part 7:2020	Semiconductor Devices — Discrete Devices Part 7 Bipolar Transistors ( First Revision )	Bureau of ..	2020-03-08	现行
	IEC 60747-7 Ed. 3.0	Semiconductor devices - Discrete devices Part 7: Bipolar transistors （IEC 60747-7:2010 ）	Internatio..	2020-03-08	现行
	BIS IS 14901-7:2010	Semiconductor Devices - Discrete Devices And Integrated Circuits - Part 7: Bipolar Transistors	Bureau of ..	2020-03-08	被替代
	BIS IS 14901-7:2001	Semiconductor Devices - Discrete Devices And Integrated Circuits - Part 7: Bipolar Transistors	Bureau of ..	2020-03-08	被替代
	BIS IS 14901-1:2001	Semiconductor Devices - Discrete Devices And Integrated Circuits - Part 1: General	Bureau of ..	2020-03-08	被替代
	IEC 60747-8 Ed. 3.0	Semiconductor devices - Discrete devices Part 8: Field-effect transistors	Internatio..	2020-03-08	现行
	ASTM F996-11(2018)	Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current–Voltage Characteristics	American S..	2018-03-01	现行
	KS C IEC 60747-7:2017	Semiconductor devices - Discrete devices - Part 7:Bipolar transistors	Korean Sta..	2017-05-30	废止
	KS C IEC 60747-4:2017	Semiconductor devices - Discrete devices - Part 4:Microwave diodes and transistors	Korean Sta..	2017-05-30	废止
	IEC 60747-4 Amd.1 Ed. 2.0	Amendment 1 - Semiconductor devices - Discrete devices Part 4: Microwave diodes and transistors	Internatio..	2017-01-30	现行
	IEC 60747-4 Ed. 2.1	Semiconductor devices - Discrete devices Part 4: Microwave diodes and transistors	Internatio..	2017-01-30	现行
	SS EN 60191-4 Ed. 2 (2014)	Mechanical Standardization Of Semiconductor Devices - Part 4: Coding System And Classification Into Forms Of Package Outlines For Semiconductor Device Packages	Standardis..	2014-05-14	现行
	BS IEC 60747-8:2010	Semiconductor devices. Discrete devices. Field-effect transistors	British St..	2011-06-30	现行
	BS IEC 60747-7:2010	Semiconductor devices. Discrete devices. Bipolar transistors	British St..	2011-02-28	现行
	ASTM F996-11	Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics	American S..	2011-01-01	被替代
	NEN IEC 60747-8:2011	Semiconductor Devices - Discrete Devices - Part 8: Field-Effect Transistors	Nederlands..	2011-01-01	现行
	NEN IEC 60747-7:2011	Semiconductor Devices - Discrete Devices - Part 7: Bipolar Transistors	Nederlands..	2011-01-01	现行

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