IEC 60749-17 Ed. 1.0现行
Semiconductor devices - Mechanical and climatic test methods Part 17: Neutron irradiation
出版：International Electrotechnical Committee
专家解读视频
Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
BS EN 60749-17:2003 - Identical
SN EN 60749-17:2003 - Identical
CEI EN 60749-17 Ed. 1 (2004) - Identical
OVE/ONORM EN 60749-17:2003 - Identical
NEN EN IEC 60749-17:2003 - Identical
EN 60749-17:2003 - Identical
SS EN 60749-17 Ed. 1 (2003) - Identical
PN EN 60749-17:2005 - Identical
I.S. EN 60749-17:2003 - Identical
NF EN 60749-17:2003 - Identical
DIN EN 60749-17 (2003-09) - Identical
