IEC 60749-8 : 1.0现行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 8: SEALING
出版：International Electrotechnical Committee
专家解读视频
Applies to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices.
NEN EN IEC 60749-8 : 2003 - Identical
PN EN 60749-8 : 2005 - Identical
BS EN 60749-8 : 2003 - Identical
CEI EN 60749-8 : 2004 - Identical
I.S. EN 60749-8:2003 - Identical
DIN EN 60749-8 : 2003 - Identical
DS EN 60749-8 : 2003 - Identical
