NEN EN IEC 60749-20:2003被替代
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 20: Resistance Of Plastic-encapsulated Smds To The Combined Effect Of Moisture And Soldering Heat
出版：Nederlands Normalisatie Instituut
专家解读视频
基本信息
标准编号： NEN EN IEC 60749-20:2003
发布时间：2003/8/1 0:00:00
标准类别：Standard
出版单位：Nederlands Normalisatie Instituut
标准页数：49
标准简介
Defines a test method for assessing the resistance to soldering heat of plastic-encapsulated surface mount devices (SMDs). Applies to semiconductor devices (discrete devices and integrated circuits).
替代本标准的新标准
等同采用的国际标准
IEC 60749-20 Ed. 1.0 - Identical
