NF EN 60749-3:2002现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 3: External Visual Examination
出版：Association Francaise de Normalisation
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Verifies that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document.
Indice de classement: C96-022-3. (03/2003) Supersedes NF EN 60749. (06/2007)
I.S. EN 60749-3:2017 - Identical
DIN EN 60749-3 : 2003 - Identical
BS EN 60749-3 : 2017 - Identical
DIN EN 60749-3 : 2003 - Identical
BS EN 60749-3:2017 - Identical
EN 60749-3:2017 - Identical
BS EN 60749-3:2002 - Identical
DIN EN 60749-3 (2003-04) - Identical
NBN EN 60749-3:2003 - Identical
I.S. EN 60749-3:2002 - Identical
IEC 60749-3 Ed. 1.0 - Identical
SS EN 60749-3 Ed. 1 (2003) - Identical
UNE EN 60749-3:2003 - Identical
