NEN EN IEC 60749-9:2002被替代
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 9: Permanence Of Marking
出版：Nederlands Normalisatie Instituut
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基本信息
标准编号： NEN EN IEC 60749-9:2002
发布时间：2002/9/1 0:00:00
标准类别：Standard
出版单位：Nederlands Normalisatie Instituut
标准页数：9
标准简介
Describes about the test and verifies that the markings on semiconductor devices will not become illegible when subject to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process.
标准备注
Partially supersedes NEN EN IEC 60749. (12/2002)
本标准替代的旧标准
替代本标准的新标准
