IEC/TS 62396-2 Ed. 1.0被替代
Process management for avionics - Atmospheric radiation effects Part 2: Guidelines for single event effects testing for avionics systems
出版：International Electrotechnical Committee
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基本信息
标准编号： IEC/TS 62396-2 Ed. 1.0
发布时间：2008/8/19 0:00:00
标准类别：TechnicalSpecification
出版单位：International Electrotechnical Committee
标准页数：27
标准简介
IEC TS 62396-2:2008 (E) provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.
本标准替代的旧标准
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