IEC/PAS 62396-2 Ed. 1.0被替代
Process management for avionics - Atmospheric radiation effects Part 2: Guidelines for single event effects testing for avionics systems
出版：International Electrotechnical Committee
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基本信息
标准编号： IEC/PAS 62396-2 Ed. 1.0
发布时间：2007/9/18 0:00:00
标准类别：Standard
出版单位：International Electrotechnical Committee
标准页数：23
标准简介
Provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.
替代本标准的新标准
