机电零部件综合 -环标网

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标准编号	标准名称	发布部门	发布日期	状态
I.S. EN IEC 60512-8-3:2018	Connectors for Electrical and Electronic Equipment - Tests and Measurements Part 8-3: Static Load Tests (fixed Connectors) - Test 8c: Robustness of Actuating Lever	National S..	2018-04-10	现行
JIS C 5402-17-3:2018	Connectors For Electronic Equipment - Tests And Measurements - Part 17-3: Cable Clamping Tests - Test 17c: Cable Clamp Resistance To Cable Pull (tensile)	Japanese S..	2018-02-20	现行
IEC 60512-8-3 Ed. 2.0	Connectors for electrical and electronic equipment - Tests and measurements Part 8-3: Static load tests (fixed connectors) - Test 8c: Robustness of actuating lever	Internatio..	2018-01-12	现行
JIS C 5402-22-1:2016	Connectors For Electronic Equipment - Tests And Measurements - Part 22-1: Capacitance Tests - Test 22a: Capacitance	Japanese S..	2016-12-20	现行
DIN EN 62047-1 (2016-12)	Semiconductor Devices - Micro-electromechanical Devices - Part 1: Terms And Definitions (iec 62047-1:2016)	German Ins..	2016-12-01	现行
DIN EN 62047-29 (2016-08)	Semiconductor devices - Micro-electromechanical devices Part 29: Electromechanical relaxation test method for freestanding conductive thin-films under room temperature (IEC 47F/243/CD:2016)	German Ins..	2016-08-01	现行
DIN CLC/TS 50625-3-1 (2016-04)	Collection, Logistics & Treatment Requirements For Weee - Part 3-1: Specification For De-pollution - General	Verband De..	2016-04-01	现行
JIS C 5402-7-1:2016	Connectors For Electronic Equipment - Tests And Measurements - Part 7-1: Impact Tests (free Connectors) - Test 7a: Free Fall (repeated)	Japanese S..	2016-03-22	现行
JIS C 5402-9-1:2016	Connectors For Electronic Equipment - Tests And Measurements - Part 9-1: Endurance Tests - Test 9a: Mechanical Operation	Japanese S..	2016-03-22	现行
JIS C 5402-8-1:2016	Connectors For Electronic Equipment - Tests And Measurements - Part 8-1: Static Load Tests (fixed Connectors) - Test 8a: Static Load, Transverse	Japanese S..	2016-03-22	现行
DIN EN 62047-15 (2016-01)	Semiconductor Devices - Micro-electromechanical Devices - Part 15: Test Method Of Bonding Strength Between Pdms And Glass (iec 62047-15:2015)	German Ins..	2016-01-01	现行
KS C IEC 60512-1-3:2015	Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 1:General examination - Section 3:Test 1c - Electrical engagement length	Korean Sta..	2015-12-28	废止
DIN EN 62047-16 (2015-12)	Semiconductor Devices - Micro-electromechanical Devices - Part 16: Test Methods For Determining Residual Stresses Of Mems Films - Wafer Curvature And Cantilever Beam Deflection Methods (iec 62047-16:2015)	German Ins..	2015-12-01	现行
DIN EN 62047-17 (2015-12)	Semiconductor Devices - Micro-electromechanical Devices - Part 17: Bulge Test Method For Measuring Mechanical Properties Of Thin Films (iec 62047-17:2015)	German Ins..	2015-12-01	现行
OVE/ONORM EN 62047-21:2015	Semiconductor Devices - Micro-Electromechanical Devices - Part 21: Test Method For Poisson's Ratio Of Thin Film Mems Materials (Iec 62047-21:2014)	Osterreich..	2015-06-01	现行
OVE/ONORM EN 62047-22:2015	Semiconductor Devices - Micro-Electromechanical Devices - Part 22: Electromechanical Tensile Test Method For Conductive Thin Films On Flexible Substrates (Iec 62047-22:2014)	Osterreich..	2015-06-01	现行
NEN EN 50625-2-2:2015	Collection, Logistics & Treatment Requirements For Weee - Part 2-2: Treatment Requirements For Weee Containing Crts And Flat Panel Displays	Nederlands..	2015-06-01	现行
OVE/ONORM EN 50625-2-1:2015	Collection, Logistics And Treatment Requirements For Weee - Part 2-1: Treatment Requirements For Lamps	Osterreich..	2015-05-01	现行
JIS C 5402-17-4:2015	Connectors For Electronic Equipment - Tests And Measurements - Part 17-4: Cable Clamping Tests - Test 17d: Cable Clamp Resistance To Cable Torsion	Japanese S..	2015-04-20	现行
JIS C 5402-17-1:2015	Connectors For Electronic Equipment - Tests And Measurements - Part 17-1: Cable Clamping Tests - Test 17a: Cable Clamp Robustness	Japanese S..	2015-04-20	现行

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