EIA JESD 78:2008被替代
Ic Latch-up Test
出版：JEDEC Solid State Technology Association
专家解读视频
基本信息
标准编号： EIA JESD 78:2008
发布时间：2008/12/1 0:00:00
标准类别：Standard
出版单位：JEDEC Solid State Technology Association
标准页数：0
标准简介
Specifies a defined method for latch-up testing of ICs. It defines Classes and Levels for a device's latch-up capability so that both the user and supplier understand a device's latch-up capabilities.
标准备注
Supersedes EIA JESD 17 (06/2001)
替代本标准的新标准
