EIA JESD 78:2006被替代
Ic Latch-up Test
出版：Joint Electronics Device Engineering Council (JEDEC)
专家解读视频
基本信息
标准编号： EIA JESD 78:2006
发布时间：2006/2/1 0:00:00
标准类别：Standard
出版单位：Joint Electronics Device Engineering Council (JEDEC)
标准页数：0
标准简介
Specifies a defined method for latch-up testing of ICs. It defines Classes and Levels for a device's latch-up capability so that both the user and supplier understand a device's latch-up capabilities.
标准备注
Supersedes EIA JESD 17 (06/2001)
本标准替代的旧标准
替代本标准的新标准
等同采用的国际标准
IEC/PAS 62181 Ed. 1.0 - Identical
