IEC 60749-27 Ed. 1.0被替代
Semiconductor devices - Mechanical and climatic test methods Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
出版：International Electrotechnical Committee
专家解读视频
基本信息
标准编号： IEC 60749-27 Ed. 1.0
发布时间：2003/10/21 0:00:00
标准类别：Standard
出版单位：International Electrotechnical Committee
标准页数：25
标准简介
Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model electrostatic discharge. The objective is to provide reliable, repeatable test results so that accurate classifications can be performed. The testing shall be selected from this test method or the human body model (see IEC 60749-26).
本标准替代的旧标准
替代本标准的新标准
