IEC 60749-5 Ed. 2.0现行
Semiconductor devices - Mechanical and climatic test methods Part 5: Steady-state temperature humidity bias life test
出版：International Electrotechnical Committee
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基本信息
标准编号： IEC 60749-5 Ed. 2.0
发布时间：2017/4/10 0:00:00
标准类别：Standard
出版单位：International Electrotechnical Committee
标准页数：14
标准简介
Gives a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
本标准替代的旧标准
