IEC 60749-3 Ed. 2.0现行
Semiconductor devices - Mechanical and climatic test methods Part 3: External visual examination
出版：International Electrotechnical Committee
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基本信息
标准编号： IEC 60749-3 Ed. 2.0
发布时间：2017/3/3 0:00:00
标准类别：Standard
出版单位：International Electrotechnical Committee
标准页数：16
标准简介
Aims to verify that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document.
本标准替代的旧标准
