IEC 60749 : 2.2被替代
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS
出版：International Electrotechnical Committee
专家解读视频
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.
I.S. EN 60749:1944 - Identical
UNE 20699 : 1992 - Identical
NEN 10749 : 1997 - Identical
CEI EN 60749 : 2000 AMD 2 2004 - Identical
PN EN 60749 : 2003 - Identical
DIN EN 60749 : 2002 - Identical
BIS IS 12641 : 2004 - Identical
NEN EN IEC 60749 : 99 AMD 2 2002 - Identical
DIN IEC 60749 : 1987 - Identical
