EIA JESD 372:1970 (R2009)现行
The Measurement Of Small-Signal Vhf-Uhf Transistor Admittance Parameters
出版：JEDEC Solid State Technology Association
专家解读视频
基本信息
标准编号： EIA JESD 372:1970 (R2009)
发布时间：2009/3/1 0:00:00
标准类别：Standard
出版单位：JEDEC Solid State Technology Association
标准页数：18
标准简介
Describes the method to be used for the measurement of small-signal VHF-UHF transistor admittance parameters, in preparing data sheets for JEDEC registration of low power transistors.
标准备注
Renamed from EIA 372. (07/2010)
本标准替代的旧标准
