EIA JESD 311:1981 (R2009)现行
Measurement Of Transistor Noise Figure At Mf, Hf, And Vhf
出版：JEDEC Solid State Technology Association
专家解读视频
基本信息
标准编号： EIA JESD 311:1981 (R2009)
发布时间：2009/3/1 0:00:00
标准类别：Standard
出版单位：JEDEC Solid State Technology Association
标准页数：26
标准简介
Specifies a test method for measurement of transistor noise figure and effective input noise temperature at MF, HF, and VHF. Also, adds the necessary information to make 'effective input noise temperature measurements'.
标准备注
Renamed from EIA 311. (07/2010)
本标准替代的旧标准
