EIA 311:1981 (R1999)被替代
Measurement Of Transistor Noise Figure At Mf, Hf, And Vhf
出版：JEDEC Solid State Technology Association
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基本信息
标准编号： EIA 311:1981 (R1999)
发布时间：1981/11/1 0:00:00
标准类别：Standard
出版单位：JEDEC Solid State Technology Association
标准页数：20
标准简介
Describes a test method for measurement of transistor noise figure and effective input noise temperature at MF, HF, and VHF. It also adds the necessary information to make "effective input noise measurements." This method is a revision of EIA-311 and incorporates material previously found in EIA-283.
替代本标准的新标准
