CEI EN 60749-4 : 2004现行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 4: DAMP HEAT, STEADY STATE, HIGHLY ACCELERATED STRESS TEST (HAST)
出版：Comitato Elettrotecnico Italiano
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基本信息
标准编号： CEI EN 60749-4 : 2004
发布时间：2004/1/1 0:00:00
标准类别：Standard
出版单位：Comitato Elettrotecnico Italiano
标准页数：16
标准简介
Gives the highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.
本标准替代的旧标准
