IEC 60749-4 : 2.0现行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 4: DAMP HEAT, STEADY STATE, HIGHLY ACCELERATED STRESS TEST (HAST)
出版：International Electrotechnical Committee
专家解读视频
Gives a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.
DS EN 60749-4 : 2017 - Identical
BS EN 60749-4 : 2002 - Identical
NEN EN IEC 60749-4 : 2017 - Identical
EN 60749-4 : 2017 - Identical
CEI EN 60749-4 : 2004 - Identical
DIN EN 60749-4 : 2016 - Identical
PN EN 60749-4 : 2017 - Identical
NEN EN IEC 60749-4 : 2017 - Identical
CEI EN 60749-4 : 2004 - Identical
BS EN 60749-4 : 2017 - Identical
SAC GB/T 4937-4 : 2012 - Identical
DS EN 60749-4 : 2017 - Identical
PN EN 60749-4 : 2017 - Identical
DIN EN 60749-4 : 2016 - Identical
