EIA JESD 398:1972 (R2009)现行
Measurement Of Small Values Of Transistor Capacitance
出版：JEDEC Solid State Technology Association
专家解读视频
基本信息
标准编号： EIA JESD 398:1972 (R2009)
发布时间：2009/3/1 0:00:00
标准类别：Standard
出版单位：JEDEC Solid State Technology Association
标准页数：18
标准简介
Contains a three-terminal procedure for capacitance measurement with precautions for shielding of extraneous effects due to terminal leads and metal enclosures.
标准备注
Renamed from EIA 398. (07/2010)
本标准替代的旧标准
