EIA 398:1972 (R1999)被替代
Measurement Of Small Values Of Transistor Capacitance
出版：Joint Electronics Device Engineering Council (JEDEC)
专家解读视频
基本信息
标准编号： EIA 398:1972 (R1999)
发布时间：1972/7/1 0:00:00
标准类别：Standard
出版单位：Joint Electronics Device Engineering Council (JEDEC)
标准页数：0
标准简介
Contains a three-terminal procedure for capacitance measurement with precautions for shielding of extraneous effects due to terminal leads and metal enclosures.
替代本标准的新标准
