UNE-EN IEC 60749-18:2019现行
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (Endorsed by Asociación Espa?ola de Normalización in July of 2019.)
出版：Asociacion Espanola de Normalizacion
专家解读视频
This part of IEC 60749 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source. Other suitable radiation sources can be used.
EN IEC 60749-18 : 2019 - Identical
IEC 60749-18:2019 - Identical
IEC 60749-18:2019 - Identical
EN IEC 60749-18 : 2019 - Identical
IEC 60749-18:2019 - Identical
