
SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 21: TEST METHOD FOR POISSON'S RATIO OF THIN FILM MEMS MATERIALS
出版:Comitato Elettrotecnico Italiano

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基本信息
标准编号: CEI EN 62047-21 : 2016
标准类别:Standard
出版单位:Comitato Elettrotecnico Italiano
标准页数:0
标准简介
Defines the determination of Poisson's ratio from the test results obtained by the application of uniaxial and biaxial loads to thin-film micro-electromechanical systems (MEMS) materials with lengths and widths less than 10 mm and thicknesses less than 10 [mu]m.