
SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 21: TEST METHOD FOR POISSON'S RATIO OF THIN FILM MEMS MATERIALS
出版:International Electrotechnical Committee

专家解读视频
Defines the determination of Poisson's ratio from the test results obtained by the application of uniaxial and biaxial loads to thin-film micro-electromechanical systems (MEMS) materials with lengths and widths less than 10 mm and thicknesses less than 10 [mu]m.
NEN EN IEC 62047-21 : 2014 - Identical
PN EN 62047-21 : 2014 - Identical
NF EN 62047-21 : 2014 - Identical
NBN EN 62047-21 : 2014 - Identical
DIN EN 62047-21 : 2015 - Identical
CEI EN 62047-21 : 2016 - Identical
BS EN 62047-21 : 2014 - Identical
DS EN 62047-21 : 2014 - Identical