IEC 60749-4 Ed. 2.0现行
Semiconductor devices - Mechanical and climatic test methods Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
出版：International Electrotechnical Committee
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基本信息
标准编号： IEC 60749-4 Ed. 2.0
发布时间：2017/3/3 0:00:00
标准类别：Standard
出版单位：International Electrotechnical Committee
标准页数：14
标准简介
Gives a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.
本标准替代的旧标准
