BS EN 60749-28 : 2017现行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 28: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - CHARGED DEVICE MODEL (CDM) - DEVICE LEVEL (IEC 60749-28:2017)
出版：British Standards Institution
专家解读视频
Defines the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD).
EN 60749-28 : 2017 - Identical
IEC 60749-28 : 1ED 2017 - Identical
IEC 60749-28 : 1ED 2017 - Identical
EN 60749-28 : 2017 - Identical
