IEC 60749-28 : 1ED 2017现行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 28: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - CHARGED DEVICE MODEL (CDM) - DEVICE LEVEL
出版：International Electrotechnical Committee
专家解读视频
Describes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD).
EN 60749-28 : 2017 - Identical
NEN EN IEC 60749-28 : 2017 - Identical
BS EN 60749-28 : 2017 - Identical
DIN EN 60749-28 : 2012 - Identical
VDE 0884-749-28 : 2018 - Identical
NF EN 60749-28 : 2013 PR - Identical
DS EN 60749-28 : 2017 - Identical
PN EN 60749-28 : 2017 - Identical
CEI EN 60749-28 : 1ED 2017 - Identical
NEN EN IEC 60749-28 : 2017 - Identical
BS EN 60749-28 : 2017 - Identical
EN 60749-28 : 2017 - Identical
DS EN 60749-28 : 2017 - Identical
