I.S. EN 60749-28:2017现行
Semiconductor Devices - Mechanical and Climatic Test Methods Part 28: Electrostatic Discharge (esd) Sensitivity Testing - Charged Device Model (cdm) - Device Level
出版：National Standards Authority of Ireland
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基本信息
标准编号： I.S. EN 60749-28:2017
发布时间：2017/7/18 0:00:00
标准类别：Standard
出版单位：National Standards Authority of Ireland
标准页数：56
标准简介
Defines the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD).
等同采用的国际标准
EN 60749-28 : 2017 - Identical
EN 60749-28 : 2017 - Identical
EN 60749-28:2017 - Identical
