IEC/PAS 62175 Ed. 1.0被替代
Marking permanency test method
出版：International Electrotechnical Committee
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基本信息
标准编号： IEC/PAS 62175 Ed. 1.0
发布时间：2000/8/1 0:00:00
标准类别：Standard
出版单位：International Electrotechnical Committee
标准页数：5
标准简介
Verifies that the markings on solid state semiconductor devices will not become illegible when subjected to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process.
替代本标准的新标准
