CEI EN 60749-9 : 2004现行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 9: PERMANENCE OF MARKING
出版：Comitato Elettrotecnico Italiano
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基本信息
标准编号： CEI EN 60749-9 : 2004
发布时间：2004/1/1 0:00:00
标准类别：Standard
出版单位：Comitato Elettrotecnico Italiano
标准页数：12
标准简介
Describes the marks on solid state semiconductor devices will remain legible when subjected to the application and removal of labels or the use of solvents and cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board manufacturing process.
本标准替代的旧标准
等同采用的国际标准
EN 60749-9 : 2017 - Identical
IEC 60749-9 ED 2 : 2017 - Identical
IEC 60749-9 ED 2 : 2017 - Identical
