IEC 60749-9 Ed. 2.0现行
Semiconductor devices - Mechanical and climatic test methods Part 9: Permanence of marking
出版：International Electrotechnical Committee
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基本信息
标准编号： IEC 60749-9 Ed. 2.0
发布时间：2017/3/3 0:00:00
标准类别：Standard
出版单位：International Electrotechnical Committee
标准页数：14
标准简介
Aims to determine whether the marks on solid state semiconductor devices will remain legible when subjected to the application and removal of labels or the use of solvents and cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board manufacturing process.
本标准替代的旧标准
