CEI EN 60749-28 : 1ED 2017现行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 28: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - CHARGED DEVICE MODEL (CDM) - DEVICE LEVEL
出版：Comitato Elettrotecnico Italiano
专家解读视频
基本信息
标准编号： CEI EN 60749-28 : 1ED 2017
标准类别：Standard
出版单位：Comitato Elettrotecnico Italiano
标准页数：0
标准简介
Sets up the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD).
