DS EN 60749-32:2004现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 32: Flammability Of Plastic-Encapsulated Devices (Externally Induced)
出版：Danish Standards
专家解读视频
基本信息
标准编号： DS EN 60749-32:2004
发布时间：2010/11/5 0:00:00
标准类别：Standard
出版单位：Danish Standards
标准页数：28
标准简介
Pertains to semiconductor device (discrete devices and integrated circuits). The aim of this test is to determine whether the device ignites due to external heating.
标准备注
2004 version includes corrigendum 1. (08/2010)
等同采用的国际标准
EN 60749-32:2003 - Identical
