NF EN 60749-43:2017现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 43: Guidelines For Ic Reliability Qualification Plans
出版：Association Francaise de Normalisation
专家解读视频
2017 [01/09/2017]2016 PR [01/11/2016]
Indice de classement: C96-022-43. PR NF EN 60749-43 November 2016. (01/2017)
EN 60749-43:2017 - Identical
IEC 60749-43 : 1ED 2017 - Identical
EN 60749-43 : 2017 - Identical
IEC 60749-43 : 1ED 2017 - Identical
EN 60749-43 : 2017 - Identical
