IEC 63287-1:2021现行
Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
出版：International Electrotechnical Committee
专家解读视频
IEC 63287-1:2021 gives guidelines for reliability qualification plans of semiconductor integrated circuit products. This document is not intended for military- and space-related applications.NOTE 1The manufacturer can use flexible sample sizes to reduce cost and maintain reasonable reliability by this guideline adaptation based on EDR-4708, AEC Q100, JESD47 or other relevant document can also be applicable if it is specified.NOTE 2The Weibull distribution method used in this document is one of several methods to calculate the appropriate sample size and test conditions of a given reliability project.This first edition of IEC 63287-1 cancels and replaces the first edition of IEC 60749-43 published in 2017. This edition constitutes a technical revision.This edition includes the following significant technical changes with respect to the previous edition:the document has been renamed and renumbered to distinguish it from the IEC 60749 (all parts);a new section concerning the concept of "family" has been added with appropriate renumbering of the existing text.
EN IEC 63287-1:2021 - Identical
I.S. EN IEC 63287-1:2021 - Identical
DS/EN IEC 63287-1:2021 - Identical
BS EN IEC 63287-1:2021 - Identical
UNE-EN IEC 63287-1:2021 - Identical
UTG 1:2022 - Identical
CEI EN IEC 63287-1:2022 - Identical
PN-EN IEC 63287-1:2022-05 - Identical
OVE EN IEC 63287-1:2023 10 01 - Identical
