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IEC 60147-2J被替代

Essential Ratings And Characteristics Of Semiconductor Devices And General Principles Of Measuring Methods - Ninth Supplement: Chapter Vii: Analogue Integrated Circuits

出版：International Electrotechnical Committee

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基本信息

标准编号： IEC 60147-2J

标准类别：Standard

出版单位：International Electrotechnical Committee

标准页数：0

标准简介

替代本标准的新标准

IEC 60747-6 Ed. 2.0

IEC 60747-2 Ed. 2.0

IEC 60747-1 Ed. 2.0

等同采用的国际标准

DIN 44480-31 (1980-05) - Similar

DIN 44480-30 (1980-05) - Similar

DIN 44480-29 (1980-05) - Similar

DIN 44480-64 (1984-03) - Equivalent

DIN 44480-63 (1983-05) - Similar

DIN 44480-49 (1983-05) - Similar

DIN 44480-48 (1983-05) - Similar

DIN 44480-47 (1983-05) - Similar

DIN 44480-46 (1983-05) - Similar

DIN 44480-45 (1982-03) - Similar

DIN 44480-44 (1983-05) - Similar

DIN 44480-39 (1982-03) - Similar

DIN 44480-38 (1982-03) - Similar

DIN 44480-34 (1981-05) - Similar

DIN 44480-33 (1980-05) - Similar

NEN EN 100012:1995 - Identical

DIN 44480-28 (1980-05) - Similar

DIN 44480-27 (1980-05) - Similar

DIN 44480-26 (1980-05) - Similar

DIN 44480-25 (1980-05) - Similar

DIN 44480-1 (1980-04) - Similar

IEC 60147-2J被替代

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