IEC 60747-1 Ed. 2.0现行
Semiconductor devices Part 1: General
出版：International Electrotechnical Committee
专家解读视频
IEC 60747-1:2006 gives the general requirements applicable to the discrete semiconductor devices and integrated circuits covered by the other parts of IEC 60747 and IEC 60748 (see Annex A). This second edition of IEC 60747-1 cancels and replaces the first edition (1983) and its amendments 1 (1991), 2 (1993) and 3 (1996). The main changes with respect to the previous edition are listed below: a) The terminology which is now given in the IEV (or which was in conflict with the IEV) has been omitted. b) There has been a general revision of guidance on essential ratings and characteristics. c) The distinction between general and reference methods of measurement has been removed. d) A clause on product discontinuation notice has been added.
NEN 10747-1:1984 - Identical
DIN 41782 (1969-06) - Equivalent
SS IEC 747 Ed. 2 (1993) - Identical
BS 6493-1.1:1984 - Equivalent
NFC 96 001:1984 - Identical
NF EN 61747-1:2000 - Identical
DIN IEC 60747-1 (1987-03) - Identical
NEN IEC 60747-1:2006 - Identical
BS IEC 60747-1:2006+A1:2010 - Identical
