
Connectors For Electronic Equipment - Tests And Measurements - Part 6-2: Dynamic Stress Tests - Test 6b: Bump
出版:German Institute for Standardisation (Deutsches Institut für Normung)

专家解读视频
Assess the ability of components to withstand specified severities of bump.
Supersedes DIN IEC 48B-836-CD and DIN IEC 60512-4 (01/2003)
SS EN 60512-6-2 Ed. 1 (2002) - Identical
IEC 60512-6-2 Ed. 1.0 - Identical
I.S. EN 60512-6-2:2002 - Identical
NF EN 60512-6-2:2002 - Identical
BS EN 60512-6-2:2002 - Identical
UNE EN 60512-6-2:2002 - Identical